Price On RequestOne of the most highly anticipated new standards in many years, SuperSpeed USB (USB 3.0) is the next advance for the widely adopted Universal Serial Bus (USB) standard. The key performance upgrade of SuperSpeed USB is an increase in the data rate from 480Mb/s to 5 Gb/s--ten times faster than USB 2.0. However, the higher speed and more complex features create more complicated signals that require more sophisticated measurement and analysis. Developers face additional requirements in the new specification that blur the boundaries between physical layer testing and protocol layer testing. LeCroy s leadership in oscilloscope and protocol analyzer technology, serial data expertise, and tradition of innovation, ensures a complete suite of SuperSpeed USB test solutions that address today s challenges and anticipate increasingly integrated test methodologies. Overview Comprehensive Verification, Debug and Compliance Successful development of new USB 3.0 products requires a coordinated test program, running from transmitter testing (to verify eye diagrams, jitter, and other performance measurements), to receiver testing (to ensure reliable data transfer), to TDR testing (to ensure reliable channels, PCB designs, connectors and cables), and finally to protocol testing (to ensure functionality and compliance to USB 3.0 requirements). Single Vendor Solution LeCroy is the only company that offers a complete line of USB 3.0 test solutions covering transmitter test to protocol test, and every step in between for comprehensive verification, debug and compliance. SuperSpeed USB test needs are supplied with a single point of procurement and support. Further, LeCroy provides uniquely integrated test solutions that combine test capabilities at multiple levels and merge the results for more accurate and meaningful information. LeCroy s experience and leadership in providing high-speed serial data test tools make LeCroy the natural choice as a test partner for SuperSpeed USB development. LeCroy s test tools cover the full range of test needs: industry-leading oscilloscopes for transmitter testing, unique products such as the Protocol-enabled Receiver and Transmitter Tolerance Tester (PeRT3 ), specialized solutions for TDR testing on sampling oscilloscopes, and a full line of serial data protocol analyzers. Our test tools are not only superb in their own test areas, but because they are well integrated with each other, they help engineers easily move test designs and results from one LeCroy system to another providing quicker and deeper insight for confidence in measurement results. The Right Support for Every Stage of Development The PeRT3 Test System, which integrates receiver test with protocol-awareness, provides the ability to automate testing through active control of the device under test, and to integrate diverse test results from multiple levels. It is also able to easily manage through protocol issues such as SKP symbols which can interrupt testing on competitive products. About SuperSpeed USB Developed and promoted through the USB Implementers Forum (USB-IF), USB has been long established as the interconnect system of choice for peripheral systems. SuperSpeed USB is backwards compatible with USB 2.0, ensuring a smooth adoption path for all users. However, for developers the challenges of USB 3.0 are daunting. High-speed gigabit serial data links require new design approaches, high quality manufacturing processes, and comprehensive testing and debug procedures to achieve reliable data transfer and interoperability.
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