Profilometer

Laser Prof is an inertial profiler designed for quality control and supervision of highways. It enables the user to measure longitudinal profiles of any pavement surface. Derived results from the pavement profiles such as IRI can be calculated.Laser Prof can be configured with Texture Sensors GPS. The system is portable and easily mountable on any vehicle.Laser Prof enables the measurement at normal traffic speed, with maximum speeds exceeding 150km/h.

Laser Wheel Profilo-meter Model LPM-5 (Advance Version) designed specifically to work as per Indian Railway Standards. The profile-meter measures wheel profile very quickly by laser scanning without any contact with the wheel tread. The accompanying Android app displays the profile, wheel wear parameters. Any exceedances from standard limits are highlighted and can also be reported to others if required. The supply configuration includes handheld laser scanning hardware, basic handheld Android phone/PDA, and calibration checking template in a padded PVC carrying box.

Nanovea 3D Non-Contact Profilometers are designed with leading edge optical pens using superior white light axial chromatism. Nano through macro range is obtained during measurement (profile, dimension, roughness, finish, texture, shape, form, topography, flatness, warpage, volume, area, step-height, depth, thickness others) on a wider range of geometries and materials than any other Profilometer. With the selection of a large range of optical pens users can precisely measure an endless range of applications. Nanovea optical pens have zero influence from sample reflectivity, have advanced ability to measure high surface angles and no sample no preparation is required. Easily measure any material whether transparent, opaque, specular, diffusive, polished, rough etc. Unlike other optical measurement techniques, large surface areas can be precisely measured without any imaging stitching.

Contact and Optical Profilometer - on one platform. Automatic sample movement and one click measurement, makes NanoMap-D a step forward in imaging world.

Applications: Step height measurementsSurface roughness measurementsQuantify scratch and dig features, wear depth, width and volumeSurface flatness or curvature measurements2D thin film measurementsSurface profilingDimensional analysis and surface texture The rapid evolution in the fields of nanotechnology, thin film, data storage, MEMS, opto- electronics and other new material has lead to the need of more precise surface characterization for process development and manufacturing control of scientific research. In order to meet a wide range of application and budgetary requirements, the APE Stylus Profilometer accurately characterizes film thickness, roughness and defects on samples up to 25 mm.The high-precision stage moves a sample according to a user-programmed scan length, speed and stylus force. The video monitor allows a view of both the physical scanning of the sample and the plotting of the data simultaneously.The graphical user interface has a multi-window interface that allows a user to continually acquire and display scan data. The software comes equipped with filters for immediate analysis of acquired data. This permits the user to quickly analyse the data in a fully flexible environment. Key features Contact surface profiling by stage scanningGenerates 1D, 2D and 3D profilesZ range up to 1mmXY scanning range up to 25 mm x 25mmSimple operation with user friendly software interfaceIntegrated color optical camera for direct sample viewing during scanning

Surface Profilometer offered finds use in production site for measuring surface roughness of different machinery-processed parts. Features: Support calculation of corresponding parameters as per selected measuring conditions Allows for clear display of all measurement parameters Specifications: Product compatible with ASTM and other industry standardsSensor tests surface roughness using built-in probeOffers output of measurement results on LCDHigh accuracy based inductance sensorCompact light weight finish for easy useComes with manual/automatic shut down provisionSupport for metric/imperial conversionHaving USB data output/RS-232 data output for PC connection

The stylus profiler offers step height measurement capability for steps from a few nanometers to one millimeter, for production and R D environments. The benchtop profiler system supports 2D and 3D measurements of step heights, roughness, bow, and stress for scans up to 150mm without stitching.

A profilometer is a precision measuring instrument used to determine the surface profile, roughness, waviness, and texture of a material. It measures very small variations in surface height and provides quantitative parameters such as Ra (average surface roughness), Rz, and Rt. Profilometers are commonly used in manufacturing, mechanical engineering, automotive, semiconductor, and research laboratories for quality control and surface-finish inspection. Working Principle A typical contact profilometer uses a stylus that moves across the surface of a specimen. The stylus follows the surface irregularities, and a sensor converts these vertical movements into an electrical signal. The instrument then processes the signal and displays a surface profile and roughness values.

Our Huvitz microscope is capable of 3D Measurements and also a 3D profile of the sample can also be obtained.

Wear forms a very important aspect in tribological tests. In most tribological tests, the material under test is usually a pin or ball, and a counter specimen in the shape of a disk or plate of a significantly harder material is used. In such cases the best practice was and remains measuring the weight loss of the pin or ball at intervals during the testing.However, in the process of developing newer materials, the practically achievable hardness limits of disks is fast approaching. In other cases tribological properties between specific combinations of materials is required. High temperatures also reduce hardness of most materials. For all such research the counter-specimen i.e. disk or plate, is also a test sample and would be suffering significant wear.Weight-loss method of measuring wear of the disk may not be feasible since the weight of the disk or plate is usually quite high and weighing balances with the resolution required for tribological tests and having the range to weight a disk are not practical.Profilometers have been successfully used to measure wear formed on the track radius after test run is completed. The Ducom Non-Contact 3D Profilometer has a compound stage with X-Y movement on which the test specimen is placed to move below a white light optical pen, mounted vertically above the specimen. This optical pen is connected to an electronic unit through fiber optics cable, controller controls signal acquisition, performs signal processing, computes the distance and thickness data and transmits the data on the digital outputs (RS232 or USB).

PROFILOMETERS (BARTON COMB)

Digital Profilometer

Profilometer for Checking Tyre Tread Profile

Laser Wheel Profilometer

Profilometer

Optical Profilers for surface metrology

Profilometer for Checking Tyre Tread Profile