Scanning Probe Microscope

The invention and subsequent development of scanning probe microscopy (SPM) methods have produced the necessary tools for a step forward in optical measurements. The possibility to go beyond the Abbe diffraction limit has been achieved with the Near-field light optical microscopes (SNOM). This is employing the SPMs precision of piezoelectric raster-scanning together with small sharp optical probe to obtain optical images at subwavelength resolution. TriA-SNOM TriA SNOM combines the potentials of scanned probe technology with the power of optical microscopy. It brings a small optical probe very close to the sample surface, in the region called "near-field", and it allows the collection of optical signals providing image optical resolution below 100 nm. Key features: Integrated Double Optical Vision System for accurate positioning and far field optical investigation Compatible with a wide range of light microscope modes Separate or simultaneous transmission and reflection measurements Large Operation wavelength range Allows the light source set-up as top down or inverted Independent high-performance photo detectors for multiple optical signals collection. Easily expandable Compatibility with third party scientific equipments

Scanning tunneling microscopes (STM) allow imaging of surfaces at the atomic level

The SP25M Renishaw Scanning Probe is a compact and flexible probe designed for both scanning and touch-trigger measurement on coordinate measuring machines (CMMs). It provides high accuracy and fast data collection for surface, profile, and feature inspection. With multiple stylus options and quick-change capability, the SP25M adapts easily to different applications. Ideal for precision industries like automotive, aerospace, and tool manufacturing where detailed and reliable measurements are required.

AFM exploits atomic interaction forces between the tip and the sample surface to reconstruct the topography of the sample nanostructures

SPM observe the microstructure of sample surfaces by scanning them with a microprobe. STM, AFM and various other types of microscopes exist that detect an interaction with the surface, such as the frictional force or potential, magnetic force. These are collectively referred to as SPM. Of these, atomic force microscopes (AFM) are currently the most widely used type of SPM. AFM microscopes measure the three-dimensional shape of the surface by detecting the interatomic forces acting between the sample surface and probe and controlling the distance between the probe and surface as necessary to maintain a constant force as it scans across the sample surface. Shimadzu's SPM-9700 represents the next generation of scanning probe microscopes, offering faster observation and simpler controls. Products SPM-9700 WET-SPM Series (Environment-controlled scanning probe microscope) Applications Nanotechnology Organic Substances Minerals Polymers Metals

To fulfill the needs and demands of our customers, we are engaged in offering a quality range of CMM Scanning Probe. Our complete range is power saving and ensures long term service. In addition to this, CMM Scanning Probe is developed and designed by the leading industry experts who have gained lot of experience in this field. Features: Withstands harsh conditionsSuperior performanceDifferent designs

nanoREV is an ambient Scanning Tunneling Microscope which opens out the fascinating nano-world right on to your table-top. It is a ready-to-use instrument both for the beginners and the experts in the field of probe microscopy

LT - SHPM: Quantitative Non-invasive magnetic measurements with Scanning Hall Probe Microscopy with up to 50 nm spatial resolution Multi-Mode: AFM, MFM, STM, EFM options Real time scanning with SHPM Image Local magnetic fields with unprecedented sensitivity: 60nT/ Hz@77K, 6nT/ Hz@4.2K Fits into almost any cryostat: 23.6 mm or 25.4 mm OD Realtime scans (~1 frame/second) to investigate dynamic magnetic phenomena Large scan area at 4.2 K : 16 m x 16 m Optional 6 m x 6 m and 1.5 m x 1.5 m scan areas 3mm range X-Y positioners LT - MFM: With AFM/MFM/EFM/SSRM Options at 300mk-300K LT - SPM: Low Temperature Scanning Probe Microscope ( LT-SPM ) LT-SPM systems can be operated from 1K to 300K, in almost any platform if space permits Head Dimensions : 23.6mm OD x 125mm or 25.4mm OD x 100mm Sample Approach : Stick-slip type 10mm Z Phi 3mm XY range 50 to 800nm step size Sample Size : 15 x 15 x 5 mm maximum Temperature Range: 1.0K to 300K (limited by cryogenic equipment Magnetic Field 16T PPMS - SPM: An affordable all-in-one SPM solution for QD PPMS system with a temperature range of 2K-300K Multi-Mode: SHPM (Scanning Hall Probe Microscopy with spatial resolution up to 50 nm), Real time scanning with SHPM AFM (AKIYAMA PROBE, Quartz Tuning Fork and conventional cantilever compatible, MFM, STM, EFM options High sensitive Fiber interferometer system Quantum Design PPMS Compatible with 2K-300K Temperature Range Large scan area at 4.2 K : 18 m x 18 m Optional 6 m x 6 m and 1.5 m x 1.5 m scan areas 3mm range X-Y Positioners RT - SHPM: Multi-Mode: AFM, MFM, STM, EFM options Real time scanning with SHPM Image Local magnetic fields with unprecedented sensitivity: 7 mG/ Hz @ 300K Non-invasive: ~0.04 Gauss Self field

Low Temperature Operation at T 5 KLowest Thermal Drift Highest StabilityUltimate STM/STS/IETS PerformanceLeading QPlus AFM TechnologyVariable Temperature OperationGuided 3D Coarse PositioningFast Cool DownSafe Quick Sample/Tip Exchange

For success in materials research studies, scientists depend on professional tools that can readily provide the information needed, regardless of the tasks at hand. By advancing key technologies and designs, Nanosurf has made the Flex-Axiom one of the most versatile and flexible AFMs ever, allowing a large variety of materials research applications to be handled with ease. Together with the powerful C3000 controller, complex material characterizations are possible.

Ultra High accuracy measurement. Passive scanning. Styli range upto 800mm. Data collection rate 1000 point per sec.

Scanning Probe Microscope

Scanning Tunnelling Microscope

Scanning Tunnelling Microscope (STM)

Seal kit (verios size & veryus material)

Scanning Tunnelling Microscope (STM)

Scanning Probe Microscope

Ambient Low Temperature Scanning Probe Microscopes

Scainning

Scanning and Tunneling Microscopes

A Scanning Tunneling Microscope is a device for imaging surfaces at very high magnifications - down to the scale of individual atoms. The STM does this by mechanically scanning a pointed tip over the surface (sample to be scanned). Piezoelectric elements can provide the necessary small translations of the tip. The data acquisition and analysis software for the STM developed by Quazar Technologies is christened SiM* (Stm iMproved). SiM is written with simple Python scripts using Tkinter for the Graphical User Interface. A wrapper driver is written for the parallel port and is inserted as a kernel module (currently on vanilla kernel 2.6.17). The whole software is squashed into a KEWTI LINUX LIVE CD (based on Slackware Linux) and can be put into action by booting the system for this QLinux. The Scanning Tunneling Microscope (STM) is the ancestor of all scanning probe microscopes. It was invented in 1981 by Gred Binnig and Heinrich Rocher at IBM Zurich. Five years later they were awarded the Nobel Prize in Physics for its invention. The STM was the first instrument to generate real-space images of surface with, so called, atomic resolution (atomic lattice resolution to be precise). The software is very user-friendly and readily re-configurable.Image Display Dual-Imaging Window for Scan and Retrace Image Display. Analysis Functions Line(Single line profile) Extraction, measurement of distances and angles, Zooming, Roughness Display, X/Y/Z - Calibration, 2D Fast Fourier Transformation Image Processing Tool Powerful Image processing toolbox with various utilities like spatial, Low-Pass Filtering, Histogram, Equalization, Un-sharp masking, Slope Correction, Zooming etc. Data Export Export to standard image file formats like ASCII, jpg, png, postscript etc. Imports data from ASCII image files given in the form of data matrix 3D Data Display Colored 3D renderings, selection of color look-up tables Color Mode Selection Customizable color modes for the image (both in 2D and 3D) Tip Locator Window Displays current position of the tip over the sample, Sample Navigator for graphical X/Y adjustments, tip-positioning relative to current image. I-V Spectroscopy Sample Bias sweep from -10V to +10V, 1024 spectral points, 5mV minimum step. Nano-Lithography Tool.

Neurological Entry-Level Microscopes

A Scanning Tunneling Microscope is a device for imaging surfaces at very high magnifications - down to the scale of individual atoms. The STM does this by mechanically scanning a pointed tip over the surface (sample to be scanned). Piezoelectric elements can provide the necessary small translations of the tip. The data acquisition and analysis software for the STM developed by Quazar Technologies is christened SiM* (Stm iMproved). SiM is written with simple Python scripts using Tkinter for the Graphical User Interface. A wrapper driver is written for the parallel port and is inserted as a kernel module (currently on vanilla kernel 2.6.17 ). The whole software is squashed into a KEWTI LINUX LIVE CD (based on Slackware Linux) and can be put into action by booting

nanoREV is an ambient air STM which opens out the fascinating nano-world right on to your table-top. It is a ready-to-use instrument both for the beginners and the experts in the field of probe microscopy..